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Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

Publication Type

Journal Article

Authors

Jang, H.W, S.H Baek, D Ortiz, C.M Folkman, R.R Das, Y.H Chu, P Shafer, J.X Zhang, S Choudhury, V Vaithyanathan, Y.B Chen, D.A Felker, M.D Biegalski, M.S Rzchowski, X.Q Pan, D.G Schlom, L.Q Chen, Ramamoorthy Ramesh, C.B Eom

DOI

10.1103/PhysRevLett.101.107602

Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.

Journal

Physical Review Letters

Volume

101

Year of Publication

2008

ISSN

00319007

Notes

cited By 186

Research Areas

Ramesh Lab