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Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

Publication Type

Journal Article

Authors

Jang, H.W., S.H. Baek, D. Ortiz, C.M. Folkman, R.R. Das, Y.H. Chu, P. Shafer, J.X. Zhang, S. Choudhury, V. Vaithyanathan, Y.B. Chen, D.A. Felker, M.D. Biegalski, M.S. Rzchowski, X.Q. Pan, D.G. Schlom, L.Q. Chen, Ramamoorthy Ramesh, C.B. Eom

DOI

10.1103/PhysRevLett.101.107602

Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.

Journal

Physical Review Letters

Volume

101

Year of Publication

2008

ISSN

00319007

Research Areas

Ramesh Lab