Research Themes +
Energy Technologies Area (ETA) researchers are continually building on the strong scientific foundation we have developed over the past 50 years. We address the world’s most pressing climate challenges by bringing to market energy-efficient innovations across the buildings, transportation, and industrial sectors. ETA is at the forefront of developing better batteries for electric vehicles; improving the country's aging electrical grid and innovating distributed energy and storage solutions; developing grid-interactive, efficient buildings; and providing the most comprehensive market and data analysis worldwide for renewable technologies like wind and solar.
Strategic Initiatives +
The Energy Technologies Area (ETA) Strategic Plan is the guiding force for our research and development for the next ten years. It clearly charts a path toward clean-energy solutions and focuses on five detailed Strategic Initiatives. The Plan provides an in-depth look at how ETA is accelerating research to provide affordable, clean energy to all while accomplishing deep, economy-wide decarbonization, looking to avoid a rise in global average temperature while simultaneously developing solutions to increase humanity's resilience to extreme weather volatility.
Publications
News +
For media inquiries,
please contact ETA
Interim Communications Manager
Kiran Julin

kjulin@lbl.gov
About Us +
The Energy Technologies Area (ETA) is unique in translating fundamental scientific discoveries into scalable technology adoption. Our approach combines an understanding of the marketplace and the role of state and federal regulation and policies. ETA's research drives real-world, practical results that affect and improve the everyday lives of Americans and those across the globe. Saving energy and battling the Climate Crisis are key to the foundation of our research, which is driven by technoeconomic analysis and in-lab experimentation and discovery.

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

Publication Type

Journal Article

Authors

Steinhauer, D.E, C.P Vlahacos, F.C Wellstood, S.M Anlage, C Canedy, Ramamoorthy Ramesh, A Stanishevsky, J Melngailis

DOI

10.1063/1.1150687

Abstract

We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 μm. The microscope is sensitive to the linear permittivity, as well as to nonlinear dielectric terms, which can be measured as a function of an applied electric field. We introduce a versatile finite element model for the system, which allows quantitative results to be obtained. We demonstrate use of the microscope at 7.2 GHz with a 370 nm thick Ba0.6Sr0.4TiO3 thin film on a LaAlO3 substrate. This technique is nondestructive and has broadband (0.1-50 GHz) capability. The sensitivity of the microscope to changes in permittivity is Δ∈r=2 at ∈r=500, while the nonlinear dielectric tunability sensitivity is Δ∈113=10-3 (kV/cm)-1. © 2000 American Institute of Physics.

Journal

Review of Scientific Instruments

Volume

Year of Publication

2000

ISSN

00346748

Notes

cited By 70

Research Areas

Ramesh Lab