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Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates

Publication Type

Journal Article

Authors

Li, H., H. Zheng, L. Salamanca-Riba, Ramamoorthy Ramesh, I. Naumov, K. Rabe

DOI

10.1063/1.1523632

Abstract

The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.

Journal

Applied Physics Letters

Volume

Year of Publication

2002

ISSN

00036951

Notes

cited By 14

Research Areas

Ramesh Lab