Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates
The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.
Applied Physics Letters
Year of Publication
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