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Nanoscale imaging of domain dynamics and retention in ferroelectric thin films

Publication Type

Journal Article

Authors

Gruverman, A, H Tokumoto, A.S Prakash, S Aggarwal, B Yang, M Wuttig, Ramamoorthy Ramesh, O Auciello, T Venkatesan

DOI

10.1063/1.120369

Abstract

We report results on the direct observation of the microscopic origins of backswitching in ferroelectric thin films. The piezoelectric response generated in the film by a biased atomic force microscope tip was used to obtain static and dynamic piezoelectric images of individual grains in a polycrystalline material. We demonstrate that polarization reversal occurs under no external field (i.e., loss of remanent polarization) via a dispersive continuous-time random walk process, identified by a stretched exponential decay of the remanent polarization. © 1997 American Institute of Physics.

Journal

Applied Physics Letters

Volume

Year of Publication

1997

ISSN

00036951

Notes

cited By 187

Research Areas

Ramesh Lab