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Magnetic characterization of epitaxial Y5FeeO 12/Bi3Fe5O12 and Y 5Fe3O12/Eu1Bi2Fe 5 O12 heterostructures grown by pulsed laser deposition

Publication Type

Journal Article

Authors

Simion, B.M, Ramamoorthy Ramesh, V.G Keramidas, G Thomas, E Marinero, R.L Pfeffer

DOI

10.1063/1.358307

Abstract

Epitaxial Y3Fe5O12(YIG)/Bi 3Fe5O12(BIG) and YIG/Eu1Bi 2Fe5O12(EBIG) heterostructures have been grown on [111] oriented single-crystalline gadolinium-gallium-garnet substrates by pulsed laser deposition. The effects of the layer thickness ratios on the composition, microstructure, and magnetic properties of the films have been studied employing x-ray diffraction, Rutherford backscattering spectroscopy, vibration sample magnetometry, and Kerr magnetometry. All films under investigation are single crystalline, in the [111] orientation. The multilayered heterostructures displayed superior magnetic properties in comparison to their single crystalline monolayer counterparts, deposited at the same conditions. The YIG/BIG heterostructures indicate increased in-plane saturation magnetic moments, approaching the maximum saturation value in bulk YIG. The YIG/EBIG heterostructures show a definite reorientation of the magnetic moment in the out-of-plane direction, a new set of increased saturation magnetization values that go even above that recorded for the bulk YIG, as well as an increase in coercivity.

Journal

Journal of Applied Physics

Volume

Year of Publication

1994

ISSN

00218979

Notes

cited By 13

Research Areas

Ramesh Lab