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Electric field induced SHG in PZT thin films studied using near-field scanning optical microscopy

Publication Type

Conference Paper

Authors

Liang, H.Y, I.I Smolyaninov, J Li, V Nagarajan, Ramamoorthy Ramesh, C.C Davis, C.H Lee

Abstract

Near-field second harmonic microscopy was applied to imaging of the metal-PZT-metal structure, good contrast between metal and ferroelectric part has been observed. SHG dependence on electric field has been measured locally. © 2002 Optical Society of America.

Journal

OSA Trends in Optics and Photonics Series

Volume

Year of Publication

2003

ISSN

10945695

Notes

cited By 0

Research Areas

Ramesh Lab