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Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films

Publication Type

Journal Article

Authors

Li, Y., V. Nagarajan, S. Aggarwal, Ramamoorthy Ramesh, L.G. Salamanca-Riba, L.J. Martínez-Miranda

DOI

10.1063/1.1513195

Abstract

Depth profile study of ferroelectric PbZr0.2Ti0.8O3 films was carried out using grazing incident x-ray scattering (GIXS) method. GIXS measurements show the evolution of in-plane compression of the lattice parameter as a function of depth within the films. The results indicate that measured in-plane lattice parameters are asymmetric, which suggest an orthorhombic distortion of the lattice in the plane of the films.

Journal

Journal of Applied Physics

Volume

Year of Publication

2002

ISSN

00218979

Notes

cited By 16

Research Areas

Ramesh Lab