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Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by z-contrast imaging

Publication Type

Journal Article

Authors

Chang, H.J., S.V. Kalinin, A.N. Morozovska, M. Huijben, Y.-H. Chu, P. Yu, Ramamoorthy Ramesh, E.A. Eliseev, G.S. Svechnikov, S.J. Pennycook, A.Y. Borisevich

DOI

10.1002/adma.201004641

Abstract

Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy(STEM) (a STEM image, b corresponding displacement profile) is combined with Landau Ginsburg Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Journal

Advanced Materials

Volume

Year of Publication

2011

ISSN

09359648

Notes

cited By 64

Research Areas

Ramesh Lab