Publications
Publications by Research Area
Publications by Division
X Author: W Wei
2018
Satjaritanun, P, S Hirano, A D Shum, Iryna V Zenyuk, Adam Z Weber, J W Weidner, and S Shimpalee."Fundamental Understanding of Water Movement in Gas Diffusion Layer under Different Arrangements Using Combination of Direct Modeling and Experimental Visualization."Journal of The Electrochemical Society
165.13 (2018) F1115 - F1126. DOI
2017
Weidner, John W, Perla B Balbuena, Adam Z Weber, Venkat Srinivasan, and Venkat R Subramanian."Mathematical Modeling of Electrochemical Systems at Multiple Scales in Honor of Professor John Newman."Journal of The Electrochemical Society
164.11 (2017) Y13 - Y13. DOI
Garrick, Taylor R, Kenneth Higa, Shao-Ling Wu, Yiling Dai, Xinyu Huang, Venkat Srinivasan, and John W Weidner."Modeling Battery Performance Due to Intercalation Driven Volume Change in Porous Electrodes."Journal of The Electrochemical Society
164.11 (2017) E3592 - E3597. DOI
2005
Srinivasan, Venkat, Bahne C Cornilsen, and John W Weidner."A nonstoichiometric structural model to characterize changes in the nickel hydroxide electrode during cycling."Journal of Solid State Electrochemistry
9.2 (2005) 61-76. DOI
2001
Srinivasan, Venkat, John W Weidner, and John S Newman."Hysteresis During Cycling of Nickel Hydroxide Active Material."Journal of the Electrochemical Society
148.9 (2001) A969-A980. DOI
1996
Dhote, A.M, S Madhukar, W Wei, T Venkatesan, Ramamoorthy Ramesh, and C.M Cotell."Direct integration of ferroelectric La-Sr-Co-O/Pb-Nb-Zr-Ti-O/La-Sr-Co-O capacitors on silicon with conducting barrier layers."Applied Physics Letters
68 (1996) 1350-1352. DOI
Wei, W, A.M Dhote, Ramamoorthy Ramesh, and S Sauvage."Reliability studies of polycrystalline La-Sr-Co-O/Pb-La-Zr-Ti-O/La-Sr-Co-O capacitors on silicon."Integrated Ferroelectrics
12 (1996) 53-62. DOI
1995
Dhote, A.M, S Madhukar, W Wei, T Venkatesan, Ramamoorthy Ramesh, and C.M Cotell."Direct integration of ferroelectric La-Sr-Co-O/Pb-Nb-Zr-Ti-O/La-Sr-Co-O capacitors on silicon with conducting barrier layers."Applied Physics Letters
(1995) 1350. DOI