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Ferroelectric pbzr0.2ti0.8o3 thin films on epitaxial y-ba-cu-o

Publication Type

Journal Article

Authors

Ramesh, Ramamoorthy, A Inam, W.K Chan, B Wilkens, F Tillerot, T Sands, J.M Tarascon, J Bullington, J Evans

DOI

10.1080/10584589208215712

Abstract

Using a combination of pulsed laser deposition and sol-gel processing, we have fabricated epitaxial PbZr0.2Ti0.8O3/YBa2Cu3O7-x heterostructures on single crystalline [001] LaAlO3- Rutherford Backscattering studies show the composition to be the same as the nominal starting composition. Transmission electron microscopy shows the existence of a randomly oriented polycrystalline microstructure in the PZT layer with a grain size of about 500–1000Å. Microscopic pores were also observed in the PZT layer. The PZT film exhibits ferroelectric hysteresis with a saturation polarization of 22–25μC/cm2 (at 7.5V, 1kHz), a remanence of 5–6μC/cm2 and a coercive field of about 40kV/cm. © 1992, Taylor & Francis Group, LLC. All rights reserved.

Journal

Integrated Ferroelectrics

Volume

Year of Publication

1992

ISSN

10584587

Notes

cited By 0

Research Areas

Ramesh Lab