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Polarization switching of submicron ferroelectric capacitors using an atomic force microscope

Publication Type

Journal Article

Authors

Prasertchoung, S., V. Nagarajan, Z. Ma, Ramamoorthy Ramesh, J.S. Cross, M. Tsukada

DOI

10.1063/1.1707221

Abstract

The measurement of switchable pulse polarization of micron and submicron ferroelectric capacitors was discussed, using pulse switching and atomic force microscope (AFM). The measurement setup for pulsed probing to measure the switchable polarization of a submicron capacitor was a combination of a pulse generator, an AFM, a shunt resistor, and a digital sampling oscilloscope. The switchable polarization of discrete polycrystalline Pb(ZrTi)O 3 capacitors were obtained using fast square pulses with rise time on the order of tens of nanaoseconds. The results show that switchable polarization is independent of the pulse width within experimental error.

Journal

Applied Physics Letters

Volume

Year of Publication

2004

ISSN

00036951

Notes

cited By 13

Research Areas

Ramesh Lab