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Critical thickness and orbital ordering in ultrathin La0.7 Sr0.3 MnO3 films

Publication Type

Journal Article

Authors

Huijben, M., L.W. Martin, Y.-H. Chu, M.B. Holcomb, P. Yu, G. Rijnders, D.H.A. Blank, Ramamoorthy Ramesh

DOI

10.1103/PhysRevB.78.094413

Abstract

Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La0.7 Sr0.3 MnO3 films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO3 (001) substrate of only three unit cells (∼12 Å). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x2 - y2) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties. © 2008 The American Physical Society.

Journal

Physical Review B - Condensed Matter and Materials Physics

Volume

Year of Publication

2008

ISSN

10980121

Notes

cited By 289

Research Areas

Ramesh Lab