Characterization of Y-Ba-Cu-O Thin-Films and Yttria-Stabilized Zirconia Intermediate Layers on Metal-Alloys Grown by Pulsed Laser Deposition

Publication Type

Journal Article

Date Published

08/1991

Authors

DOI

Abstract

The use of an intermediate layer is necessary for the growth of YBaCuO thin films on polycrystalline metallic alloys for tape conductor applications. A pulsed laser deposition process to grow controlled‐orientation yttria‐stabilized zirconia (YSZ) films as intermediate layers on Haynes Alloy No. 230 was developed and characterized. YBaCuO films deposited on these YSZ‐coated substrates are primarily c‐axis oriented and superconducting as deposited. The best YBaCuO films grow on (001) oriented YSZ intermediate layers and have Tc (R=0) = 86.0 K and Jc ∼ 3×103 A/cm2 at 77 K.

Journal

Applied Physics Letters

Volume

59

Year of Publication

1991

Issue

6

Organization